
Article
CBase-EC: Achieving Optimal Throughput-Storage Efficiency
Trade-Off Using Erasure Codes
Chuqiao Xiao * , Yefeng Xia , Qian Zhang , Xueqing Gong * and Liyan Zhu
Citation: Xiao, C.; Xia, Y.; Zhang, Q.;
Gong, X.; Zhu, L. CBase-EC:
Achieving Optimal Throughput-
Storage Efficiency Trade-Off Using
Erasure Codes. Electronics 2021, 10,
126. https://doi.org/10.3390/
electronics10020126
Received: 12 November 2020
Accepted: 5 January 2021
Published: 8 January 2021
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4.0/).
Software Engineering Institute, East China Normal University, Shanghai 200062, China;
51184501163@stu.ecnu.edu.cn (Y.X.); 52184501012@stu.ecnu.edu.cn (Q.Z.); 51184501093@stu.ecnu.edu.cn (L.Z.)
* Correspondence: 52184501011@stu.ecnu.edu.cn (C.X.); xqgong@sei.ecnu.edu.cn (X.G.)
Abstract:
Many distributed database systems that guarantee high concurrency and scalability adopt
read-write separation architecture. Simultaneously, these systems need to store massive amounts
of data daily, requiring different mechanisms for storing and accessing data, such as hot and cold
data access strategies. Unlike distributed storage systems, the distributed database splits a table into
sub-tables or shards, and the request frequency of each sub-table is not the same within a specific
time. Therefore, it is not only necessary to design hot-to-cold approaches to reduce storage overhead,
but also cold-to-hot methods to ensure high concurrency of those systems. We present a new
redundant strategy named CBase-EC, using erasure codes to trade the performances of transaction
processing and storage efficiency for CBase database systems developed for financial scenarios of
the Bank. Two algorithms are proposed: the hot-cold tablets (shards) recognition algorithm and the
hot-cold dynamic conversion algorithm. Then we adopt two optimization approaches to improve
CBase-EC performance. In the experiment, we compare CBase-EC with three-replicas in CBase. The
experimental results show that although the transaction processing performance declined by no more
than 6%, the storage efficiency increased by 18.4%.
Keywords: erasure codes; distributed database system; hot and cold separation; storage efficiency
1. Introduction
With the increasing complexity of the Internet business model, various Distributed
Database Management System (DDBMS) architectures are emerging and developing. Re-
lational DDBMSs have always been adopted by the master/slaver read-write separation
architecture adaptive for large-scale and highly concurrent business scenarios [
1
]. More-
over, DDBMSs store massive and various data on many commodity servers daily, and the
data access mechanisms and redundancy strategies of different data need dividing [2]. In
any distributed system, whether it is a DDBMS or a distributed storage system, system
reliability needs to be guaranteed. The reliability of data storage is ensured in part by
adopting redundancy in some form, such as simple replication or a more sophisticated
erasure code (EC) strategy. Some DDBMSs always use the complete data backup strategy,
also known as multi-replicas strategy, to guarantee high system reliability, but they have
low storage utilization [
3
]. Nevertheless, due to the requirements of business and user data
integrity, a large amount of data must be stored and cannot be deleted [
4
]. As time goes on,
a significant fraction of data stored in DDBMSs is rarely accessed. These data are named
cold data [
5
]. Cold data have been identified as the fastest-growing storage segment, with
a 60% cumulative annual growth rate [6].
At present, to deal with the unavailability, or loss, of data caused by error failure,
existing disk array storage systems and distributed storage systems often use EC strategies,
which can tolerate broader classes of failure scenarios with less extra storage overhead [
7
].
Disk array storage, such as the redundant array of independent disks (RAID) organizes
multiple independent storage devices (HDD, SSD) into a logically continuous storage space
Electronics 2021, 10, 126. https://doi.org/10.3390/electronics10020126 https://www.mdpi.com/journal/electronics
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